Electron microscopy - PDFSEARCH.IO - Document Search Engine

Electron microscopy
Results: 1457

#	Item
781 $Chemistry / Electron microscope / Scanning electron microscope / Ion beam / Optical microscope / Microscope / Ion milling machine / Electron backscatter diffraction / Focused ion beam / Scientific method / Electron microscopy / Science$	Ion Milling: Improving sample preparation The C2MI ion milling tool is mainly used as the final preparation step for metallographic cut (cross-section[removed]mm wide argon ion beam is used mechanically to etch the sample Add to Reading List Source URL: www.c2mi.ca Language: English - Date: 2014-11-24 15:47:45 Chemistry Electron microscope Scanning electron microscope Ion beam Optical microscope Microscope Ion milling machine Electron backscatter diffraction Focused ion beam Scientific method Electron microscopy Science
782	Electron Microscopy Laboratory Studies of Nuclear Materials The Electron Microscopy Laboratory is equipped with Scanning Electron Microscopes (SEM) and a Transmission Electron Microscope (TEM) adapted for the examination Add to Reading List Source URL: ec.europa.eu Language: English - Date: 2013-04-16 09:09:00 Actinides Nuclear materials Electron microscopy Nuclear reprocessing Nuclear chemistry Plutonium Scanning electron microscope Radioactive waste Nuclear fuel Chemistry Nuclear technology Nuclear physics
783	PhD Candidate Position at the Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (Karlsruhe, Germany) Nanotechnology requires imaging techniques with nanometer spatial resolution which yield quantitati Add to Reading List Source URL: www.lem.kit.edu Language: English - Date: 2014-07-03 04:32:24 Physics Electron microscope Transmission electron microscopy Microscope Scanning transmission electron microscopy Microscopy Focused ion beam Scanning electron microscope Electron Electron microscopy Scientific method Science
784	Super Resolution Confocal Microscopy Suite Today, 23rd September 2014, Minister Paul Kehoe TD, Government Chief Whip & Minister of State at the Departments of the Taoiseach & Defence, formally opened the Super Resolution Add to Reading List Source URL: www.tcd.ie Language: English - Date: 2014-09-24 06:09:00 Microscopy Electron microscopy Confocal microscopy CRANN Microscopes Leica Microsystems Electron microscope Nanotechnology Scientific method Science Microbiology
785	Supplementary Material for “Characterization and reduction of microfabrication-induced decoherence in superconducting quantum circuits” C. M. Quintana,1 A. Megrant,1 Z. Chen,1 A. Dunsworth,1 B. Chiaro,1 R. Barends,1 Add to Reading List Source URL: web.physics.ucsb.edu Language: English - Date: 2014-08-14 14:18:10 Semiconductor device fabrication Science Thin film deposition Physics Electromagnetism Electron beam lithography Focused ion beam Resonator Electron microscope Materials science Microtechnology Electron microscopy
786	Nuclear Safeguards and non-Proliferation Environmental Sampling Analysis A key topic in international Safeguards is the work in preventing further spread of nuclear weapon technology and nuclear materials that can be use Add to Reading List Source URL: ec.europa.eu Language: English - Date: 2013-04-16 09:09:43 Mass spectrometry Electron microscopy Spectroscopy Measuring instruments Atomic physics Secondary ion mass spectrometry Cameca Institute for Transuranium Elements Scanning electron microscope Scientific method Science Chemistry
787	Scanning electron microscope (SEM) Application:  Appraisal of polymers, stone, glass et cetera Add to Reading List Source URL: www.isc.fraunhofer.de Language: English - Date: 2014-03-14 10:01:39 Chemistry Scanning electron microscope Electron microscope Glass Sodium Vacuum Water vapor Electron Physics Scientific method Electron microscopy
788	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-19 10:56:18 Semiconductor device fabrication Electron microscopy Materials science Failure Failure analysis Reliability engineering Reliability Electron microscope Microelectromechanical systems Science Technology Electromagnetism
789	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:27:23 Nanoparticle Electron microscope Environmental scanning electron microscope Nanotechnology Electron microscopy Science Scanning electron microscope
790	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-19 10:54:40 Electron microscopy Failure Failure analysis Maintenance Problem solving Reliability engineering Wafer bonding Electron microscope Microscopy Scientific method Science Chemistry

UPDATE